BeCe™ Optical Test Socket
Redefining the standards for advanced optical and silicon photonics testing, your innovations need to break free from the constraints of traditional testing technologies in an era where chip and optical technologies converge. The BeCe™ OPS series test sockets are designed for next-generation optoelectronic integration technologies, ensuring a perfect transition of your designs from concept to mass production.
BeCe™ OPS Optical Applications
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Specifically designed for EMMI (Emission Microscopy) testing.
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Made from premium quartz materials, providing over 98% transmittance in the 400-1000 nm wavelength range.
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Unmatched optical precision combined with excellent electrical characteristics.
BeCe™ OPS Silicon Photonics Applications
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Optimized for testing Co-Packaged (Optics) co-packaged optical components.
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Perfectly supports TeraPHY MIPO I/O MCP testing requirements.
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Achieves breakthroughs in precision and reliability for optoelectronic integration testing, becoming key to overcoming bandwidth and power consumption bottlenecks with the development of data centers, AI computing, and high-speed networks.

BeCe™ Optical test socket
The BeCe™ OPS series provides you with:
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A non-destructive testing environment to ensure component integrity.
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Exceptional signal fidelity to capture the smallest changes.
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Accurate electrical and optical integration testing capabilities.
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Adaptability to meet the full process requirements from R&D to mass production.
Applicable Fields:
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Next-generation data center interconnect technologies.
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High-performance AI accelerator chips.
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Ultra-high-speed network switches.
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Optical communication components and systems.
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Advanced sensors and optical systems.
A new perspective on breakthrough performance: while competitors are still addressing fundamental testing issues, BeCe™ OPS has opened a new era in optoelectronic integration testing for you. As a technology leader, you need a testing partner who not only understands today's challenges but can also anticipate tomorrow's demands.
